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PD - 9.1327A
IRLI2505
HEXFET(R) Power MOSFET
Logic-Level Gate Drive Advanced Process Technology l Ultra Low On-Resistance l Isolated Package l High Voltage Isolation = 2.5KVRMS l Sink to Lead Creepage Dist. = 4.8mm l Fully Avalanche Rated Description
l l
D
VDSS = 55V
G S
RDS(on) = 0.008 ID = 58A
Fifth Generation HEXFETs from International Rectifier utilize advanced processing techniques to achieve the lowest possible on-resistance per silicon area. This benefit, combined with the fast switching speed and ruggedized device design that HEXFET Power MOSFETs are well known for, provides the designer with an extremely efficient device for use in a wide variety of applications. The TO-220 Fullpak eliminates the need for additional insulating hardware in commercial-industrial applications. The moulding compound used provides a high isolation capability and a low thermal resistance between the tab and external heatsink. This isolation is equivalent to using a 100 micron mica barrier with standard TO-220 product. The Fullpak is mounted to a heatsink using a single clip or by a single screw fixing.
TO-220 FULLPAK
Absolute Maximum Ratings
Parameter
ID @ TC = 25C ID @ TC = 100C IDM PD @TC = 25C VGS EAS IAR EAR dv/dt TJ T STG Continuous Drain Current, VGS @ 10V Continuous Drain Current, VGS @ 10V Pulsed Drain Current Power Dissipation Linear Derating Factor Gate-to-Source Voltage Single Pulse Avalanche Energy Avalanche Current Repetitive Avalanche Current Peak Diode Recovery dv/dt Operating Junction and Storage Temperature Range Soldering Temperature, for 10 seconds Mounting torque, 6-32 or M3 screw.
Max.
58 41 360 63 0.42 16 500 54 6.3 5.0 -55 to + 175 300 (1.6mm from case) 10 lbf*in (1.1N*m)
Units
A W W/C V mJ A mJ V/ns C
Thermal Resistance
Parameter
RJC RJA Junction-to-Case Junction-to-Ambient
Min.
---- ----
Typ.
---- ----
Max.
2.4 65
Units
C/W 8/25/97
IRLI2505
Electrical Characteristics @ TJ = 25C (unless otherwise specified)
V(BR)DSS
V(BR)DSS/TJ
Parameter Drain-to-Source Breakdown Voltage Breakdown Voltage Temp. Coefficient Static Drain-to-Source On-Resistance Gate Threshold Voltage Forward Transconductance Drain-to-Source Leakage Current Gate-to-Source Forward Leakage Gate-to-Source Reverse Leakage Total Gate Charge Gate-to-Source Charge Gate-to-Drain ("Miller") Charge Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Internal Drain Inductance Internal Source Inductance Input Capacitance Output Capacitance Reverse Transfer Capacitance Drain to Sink Capacitance
RDS(on) VGS(th) gfs IDSS IGSS Qg Qgs Qgd td(on) tr td(off) tf LD LS Ciss Coss Crss C
Max. Units Conditions --- V VGS = 0V, ID = 250A --- V/C Reference to 25C, ID = 1mA 0.008 VGS = 10V, ID = 31A 0.010 VGS = 5.0V, ID = 31A 0.013 VGS = 4.0V, ID = 26A 2.0 V VDS = VGS , ID = 250A --- S VDS = 25V, I D = 54A 25 VDS = 55V, VGS = 0V A 250 VDS = 44V, VGS = 0V, TJ = 150C 100 VGS = 16V nA -100 VGS = -16V 130 ID = 54A 25 nC VDS = 44V 67 VGS = 5.0V, See Fig. 6 and 13 --- VDD = 28V --- ID = 54A ns --- RG = 1.3, VGS = 5.0V --- RD = 0.50, See Fig. 10 Between lead, --- 4.5 --- 6mm (0.25in.) nH from package --- 7.5 --- and center of die contact --- 5000 --- VGS = 0V --- 1100 --- pF VDS = 25V --- 390 --- = 1.0MHz, See Fig. 5 --- 12 --- = 1.0MHz
Min. 55 --- --- --- --- 1.0 59 --- --- --- --- --- --- --- --- --- --- ---
Typ. --- 0.035 --- --- --- --- --- --- --- --- --- --- --- --- 12 160 43 84
D
G
S
Source-Drain Ratings and Characteristics
IS
ISM
VSD trr Qrr ton
Parameter Continuous Source Current (Body Diode) Pulsed Source Current (Body Diode) Diode Forward Voltage Reverse Recovery Time Reverse RecoveryCharge Forward Turn-On Time
Min. Typ. Max. Units
Conditions MOSFET symbol --- --- 58 showing the A G integral reverse --- --- 360 p-n junction diode. --- --- 1.3 V TJ = 25C, IS = 31A, VGS = 0V --- 140 210 ns TJ = 25C, IF = 54A --- 650 970 nC di/dt = 100A/s Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)
D
S
Repetitive rating; pulse width limited by
max. junction temperature. ( See fig. 11 ) VDD = 25V, starting TJ = 25C, L = 240H RG = 25, IAS = 54A. (See Figure 12)
Notes:
ISD 54A, di/dt 230A/s, VDD V(BR)DSS,
t=60s, =60Hz TJ 175C Pulse width 300s; duty cycle 2%. Use IRL2505 data and test conditions
IRLI2505
1000
VGS 15V 12V 10V 8.0V 6.0V 4.0V 3.0V BOTT OM 2.5V TOP
1000
ID , D ra in -to -S o u rc e C u rre n t (A )
100
ID , D ra in -to -S o u rce C u rre n t (A )
VGS 15V 12V 10V 8.0V 6.0V 4.0V 3.0V BOTTOM 2.5V TOP
100
2.5V
10
10
2 .5V 20 s PU LSE W ID TH T J = 2 5C
0.1 1 10
1
A
1 0.1 1
2 0 s PU L SE W ID TH T J = 1 75 C
10
100
A
100
V D S , Drain-to-Source V oltage (V )
V D S , Drain-to-S ource Voltage (V )
Fig 1. Typical Output Characteristics
Fig 2. Typical Output Characteristics
1000
3.0
R D S (o n ) , D ra in -to -S o u rc e O n R e si sta n ce (N o rm a li ze d )
I D = 90 A
I D , D r ain- to-S ourc e C urre nt (A )
T J = 2 5 C
100
2.5
T J = 1 7 5 C
2.0
1.5
10
1.0
0.5
1 2.5 3.5 4.5
V DS = 2 5V 2 0 s P U L S E W ID T H
5.5 6.5 7.5
A
0.0 -60 -40 -20 0 20 40 60 80
V G S = 10 V
100 120 140 160 180
A
V G S , Ga te-to-S o urce V oltage (V )
T J , Junction T emperature (C)
Fig 3. Typical Transfer Characteristics
Fig 4. Normalized On-Resistance Vs. Temperature
IRLI2505
10000 15
V G S , G a te -to -S o u rce V o lta g e (V )
8000
V GS C is s C rss C oss
= 0 V, f = 1M H z = C gs + C gd , Cds SH OR TE D = C gd = C d s + C gd
I D = 54A V DS = 44 V V DS = 28 V
12
C , C a p a c ita n c e (p F )
C i ss
6000
9
4000
C o ss
6
2000
3
C rs s
A
1 10 100
0
0 0 40 80
FO R TEST CIR CU IT SEE FIG UR E 13
120 160
A
200
V D S , D rain-to-S ource Voltage (V )
Q G , T otal Gate C harge (nC )
Fig 5. Typical Capacitance Vs. Drain-to-Source Voltage
Fig 6. Typical Gate Charge Vs. Gate-to-Source Voltage
1000
1000
I S D , R e v e rse D ra in C u rre n t (A )
OPE R ATIO N IN TH IS A RE A LIMITE D BY R DS (on)
1 0s
I D , D ra in C u rre n t (A )
100 100 s
100
TJ = 175 C T J = 25 C
1m s 10 10m s
10 0.4 0.8 1.2 1.6 2.0
VG S = 0 V
2.4
A
1 1
T C = 25 C T J = 17 5C S ing le Pulse
10 100
A
2.8
V S D , S ource-to-Drain Voltage (V )
V D S , Drain-to-Source Voltage (V)
Fig 7. Typical Source-Drain Diode Forward Voltage
Fig 8. Maximum Safe Operating Area
IRLI2505
60
VDS
50
RD
VGS RG
D.U.T.
+
ID , Drain Current (A)
40
-VDD
5.0V
30
Pulse Width 1 s Duty Factor 0.1 %
20
Fig 10a. Switching Time Test Circuit
VDS 90%
10
0 25 50 75 100 125 150 175
T C , Case Temperature
( C)
10% VGS
td(on) tr t d(off) tf
Fig 9. Maximum Drain Current Vs. Case Temperature
Fig 10b. Switching Time Waveforms
10
(Z thJC)
D = 0.50 1 0.20 0.10 0.05 0.1 0.02 0.01 SINGLE PULSE (THERMAL RESPONSE) Notes: 1. Duty factor D = t1 / t 2 2. Peak T J = P DM x Z thJC + T C 0.001 0.01 0.1 1 10 PDM t1 t2
Thermal Response
0.01 0.00001
0.0001
t1, Rectangular Pulse Duration (sec)
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case
IRLI2505
VDS D.U.T. RG + V - DD
5.0 V
E A S , S in g le P u ls e A va la n c h e E n e rg y (m J)
L
1200
TO P
1000
BO TTOM
ID 2 2A 38A 54 A
800
IAS tp
0.01
600
Fig 12a. Unclamped Inductive Test Circuit
400
200
V(BR)DSS tp VDD VDS
0
V D D = 2 5V
25 50 75 100 125 150
A
175
Starting TJ , Junction T emperature (C)
Fig 12c. Maximum Avalanche Energy Vs. Drain Current
IAS
Fig 12b. Unclamped Inductive Waveforms
Current Regulator Same Type as D.U.T.
50K
QG
12V
.2F .3F
5.0 V
QGS VG QGD
VGS
3mA
D.U.T.
+ V - DS
Charge
IG
ID
Current Sampling Resistors
Fig 13a. Basic Gate Charge Waveform
Fig 13b. Gate Charge Test Circuit
IRLI2505
Peak Diode Recovery dv/dt Test Circuit
+
Circuit Layout Considerations * Low Stray Inductance * Ground Plane * Low Leakage Inductance Current Transformer
D.U.T
+
-
+
RG * * * * dv/dt controlled by RG Driver same type as D.U.T. ISD controlled by Duty Factor "D" D.U.T. - Device Under Test
+ VDD
Driver Gate Drive P.W. Period D=
P.W. Period VGS=10V
*
D.U.T. ISD Waveform Reverse Recovery Current Body Diode Forward Current di/dt D.U.T. VDS Waveform Diode Recovery dv/dt
VDD
Re-Applied Voltage Inductor Curent
Body Diode
Forward Drop
Ripple 5%
ISD
* VGS = 5V for Logic Level Devices Fig 14. For N-Channel HEXFETS
IRLI2505
Package Outline
TO-220 FullPak Outline Dimensions are shown in millimeters (inches)
10.60 (.41 7) 10.40 (.40 9) o 3.40 (.133 ) 3.10 (.123 ) -A 3.70 (.145) 3.20 (.126) 4.8 0 (.189) 4.6 0 (.181) 2 .80 (.110) 2 .60 (.102) LE AD A S SIGN M E N T S 1 - GA TE 2 - D R AIN 3 - SO U R C E
7 .10 (.280) 6 .70 (.263)
16 .0 0 (.630) 15 .8 0 (.622)
1.15 (.04 5) M IN . 1 2 3
N O T ES : 1 D IM EN SION IN G & T O LER A N C IN G PE R AN S I Y14.5 M , 1982 2 C O N TR OLLIN G D IM EN S ION : IN C H .
3.30 (.130 ) 3.10 (.122 ) -B13 .7 0 (.540) 13 .5 0 (.530) C D
A 1.40 (.05 5) 3X 1.05 (.04 2) 2 .54 (.100) 2X 0.9 0 (.035) 3X 0.7 0 (.028) 0.25 (.010 ) M AM B 3X 0.48 (.019) 0.44 (.017)
B
2.85 (.112 ) 2.65 (.104 )
M IN IM U M C R E EP AG E D IST A NC E B ET W E EN A-B -C -D = 4.80 (.189 )
Part Marking Information
TO-220 FullPak
E XAM PLE : T HIS IS A N IRF I840G W ITH AS SE MBLY LOT CODE E401
A
INT ER NAT IONA L RE CTIF IER LOGO
PA RT NU MBE R IRF I840G
E 401 9 24 5
AS SE MBLY LOT COD E
D ATE CODE (YYW W ) YY = YE AR W W = W E EK
WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, Tel: (310) 322 3331 EUROPEAN HEADQUARTERS: Hurst Green, Oxted, Surrey RH8 9BB, UK Tel: ++ 44 1883 732020 IR CANADA: 7321 Victoria Park Ave., Suite 201, Markham, Ontario L3R 2Z8, Tel: (905) 475 1897 IR GERMANY: Saalburgstrasse 157, 61350 Bad Homburg Tel: ++ 49 6172 96590 IR ITALY: Via Liguria 49, 10071 Borgaro, Torino Tel: ++ 39 11 451 0111 IR FAR EAST: K&H Bldg., 2F, 3-30-4 Nishi-Ikeburo 3-Chome, Toshima-Ki, Tokyo Japan 171 Tel: 81 3 3983 0086 IR SOUTHEAST ASIA: 315 Outram Road, #10-02 Tan Boon Liat Building, Singapore 0316 Tel: 65 221 8371 http://www.irf.com/ Data and specifications subject to change without notice. 8/97

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